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Articles by author: V. Valvoda

• A Contribution to Micro- and Picostructural Models of Thin Polycrystalline Films
  Published in: European Powder Diffraction 3 (p85)
• Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
  Published in: European Powder Diffraction 4 (p77)
• Generalization of Empirical Texture Correction and Application to Joint Refinement
  Published in: European Powder Diffraction 3 (p97)
• Glory and Misery of the Structure Analysis of Thin Polycrystalline Films
  Published in: European Powder Diffraction (p503)
• Multilayer Structures: A Comparison of Results from XRD and from Structure Imaging Techniques
  Published in: European Powder Diffraction 5 (p158)
• Structure Analysis of Annealed Polycrystalline Ag/NiFe Multilayers
  Published in: European Powder Diffraction 4 (p499)
• Structure of TiN Thin Film Grains in Dependence on their Crystallographic Orientation
  Published in: European Powder Diffraction (p903)