Papers by Author: W. Lee

Abstract: Application potential of ZnO nanowires grown by MOCVD for atomic force microscope (AFM) probes was evaluated by predicting numerically their structural performances in terms of flexural stiffnesses and natural frequencies. Estimated properties of the nanowires suggested that they are structurally compatible with typical AFM cantilevers while maintaining mechanical stability during operation and they are therefore promising candidates for high aspect ratio probes.