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Articles by author: Wei Gao

• 3D Profile Measurement of Nanometer Cutting Edges of Single-Point Diamond Tools for Ultra-Precision Machining
  Published in: Ultra-Precision Machining Technologies (p138)
• A Biological Sensor for Detecting Foreign Bodies Using a Balloon Probe
  Published in: Measurement Technology and Intelligent Instruments VI (p133)
• A High Precision AFM for Nanometrology of Large Area Micro-Structured Surfaces
  Published in: Measurement Technology and Intelligent Instruments VI (p65)
• A Novel Control Method Using Nonlinear Observer for a XYθ_z Planar Actuator
  Published in: Measurement Technology and Intelligent Instruments VIII (p195)
• A Novel Sensorless Control of a Two-Axis Planar Motion Stage for Precision Positioning
  Published in: Manufacturing Process Technology (p4121)
• A Scanning Multi-Probe Straightness Measurement System for Alignment of Linear Collider Accelerator
  Published in: Measurement Technology and Intelligent Instruments VI (p253)
• AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces
  Published in: Measurement Technology and Intelligent Instruments VIII (p35)
• High-Aspect-Ratio and Self-Sensing Probe for AMF Based on Micro-Fabrication
  Published in: Equipment Manufacturing Technology and Automation (p1645)
• Measurement of High-NA Axisymmetric Aspherical Surface with Continuous Interference Method
  Published in: Advances in Abrasive Technology XI (p102)
• Measurement of the Straightness of a Leadscrew-Driven Precision Stage
  Published in: Measurement Technology and Intelligent Instruments VI (p259)
• Online Measurement of Micro-Aspheric Surface Profile with Compensation of Scanning Error
  Published in: Measurement Technology and Intelligent Instruments VIII (p175)
• Three-Dimensional Slit Width Measurement for Long Precision Slot Dies
  Published in: Measurement Technology and Intelligent Instruments VI (p343)