HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Y. Yamashita
8 papers on 1 page:
1
Anomalous Fast Annihilation of Thermal Donors in Carbon-Rich Silicon
Published in:
Defects in Semiconductors 18
(p1321)
Dielectric and Piezoelectric Properties of Pb[(Zn
1/3
Nb
2/3
)
0.91
Ti
0.09
]O
3
Single Crystal Grown by Solution Bridgman Method
Published in:
Electroceramics in Japan I
(p95)
Effects of Hydrogen Plasma on Dislocation Motion in Silicon
Published in:
Defects in Semiconductors 19
(p313)
Electronic State, Atomic Configuration and Local Motion of Hydrogen around Carbon in Silicon
Published in:
Defects and Diffusion in Semiconductors
(p25)
Peel Strength of Aluminum Laminate Bonded with Various Crystalline Polymer Blends
Published in:
Polymer Blends and Polymer Composites
(p155)
Stability and Defect Reaction of Two Hydrogen-Carbon Complexes in Silicon
Published in:
Defects in Semiconductors 18
(p903)
Structure and Charge-State-Dependent Instability of a Hydrogen-Carbon Complex in Silicon
Published in:
Defects in Semiconductors 19
(p247)
TEM Observation of Barium Titanate Thin Films Consisting of Nano-Sized Single Crystals Prepared by Sol-Gel Processing
Published in:
Beam Injection Assessment of Microstructures in Semiconductors
(p387)
Username:
Password: