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Articles by author: Yukiharu Uraoka

• 3-Dimensional Non-Destructive Dislocation Analyses in SiC Measured by Planar Electron-Beam-Induced Current Method
  Published in: Silicon Carbide and Related Materials 2005 (p423)
• Analysis of Hot Carrier Effect in Low-Temperature Poly-Si Thin-Film Transistors towards High Reliability
  Published in: Polycrystalline Semiconductors VI (p349)
• Anisotropic Etching of SiC in the Mixed Gas of Chlorine and Oxygen
  Published in: Silicon Carbide and Related Materials 2007 (p659)
• Bioconjugates Containing Ferritin and Metal Nanoparticles
  Published in: Advanced Materials Research II (p833)
• Characterization of 4H-SiC MOSFETs Formed on the Different Trench Sidewalls
  Published in: Silicon Carbide and Related Materials 2005 (p1293)
• Characterization of 4H-SiC MOSFETs with NO-Annealed CVD Oxide
  Published in: Silicon Carbide and Related Materials 2005 (p971)
• Criteria for Accurate Measurement of Charge-Pumping Current in 4H-SiC MOSFETs
  Published in: Silicon Carbide and Related Materials 2007 (p747)
• Effects of Nitrogen Radical Irradiation on Performance of SiC MOSFETs
  Published in: Silicon Carbide and Related Materials - 2002 (p945)
• Effects of Thermal Annealing on Cu/6H-SiC Schottky Properties
  Published in: Silicon Carbide and Related Materials 2000 (p615)
• Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers
  Published in: Silicon Carbide and Related Materials 2001 (p925)
• Evaluation of Recombination Velocity at Grain Boundaries in Poly-Si Solar Cells with Laser Beam Induced Current
  Published in: Polycrystalline Semiconductors VII (p351)
• Fast Oxidation of 4H-SiC at Room Temperature by Electrochemical Methods
  Published in: Silicon Carbide and Related Materials 2003 (p1353)
• High Purity SiC Epitaxial Growth by Chemical Vapor Deposition Using CH₃SiH₃ and C₃H₈ Sources
  Published in: Silicon Carbide and Related Materials 2005 (p203)
• High Temperature NO Annealing of Deposited SiO₂ and SiON Films on N-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p685)
• Hot Carrier Effect in Low-Temperature Poly-Silicon p-Channel Thin-Film Transistors
  Published in: Polycrystalline Semiconductors VII (p31)