HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: Zoltán Dudás
7 papers on 1 page:
1
Approximation of the Temperature and Time Dependence of the Stress versus Rupture Life Curves by Power Functions
Published in:
Materials Science, Testing and Informatics V
(p385)
Comparing of the Processes of the Isothermal Phase Transformations of the Material Type 50 CrV 4 Using Different TTT Diagrams and Applying FEM Based Phase Elements
Published in:
Materials Science, Testing and Informatics II
(p321)
Comparison of Measured Phase Volumes with Calculated ones Created by TTT-CCT Diagram Transformation
Published in:
Materials Science, Testing and Informatics III
(p497)
Creation and Use of Continuous Cooling (CC) Transformation Diagrams Based on Measured Data and T-t Elements
Published in:
Materials Science, Testing and Informatics V
(p393)
Equations and Verification of New Diffusion Parameters
Published in:
Materials Science, Testing and Informatics IV
(p293)
Transformation of Temperature and Time Diagrams Constructed by Different Time Intervals Applying the Newton Formula
Published in:
Materials Science, Testing and Informatics IV
(p299)
Virtual TTT Diagrams Generated by Multi-Linear Regression Analysis
Published in:
Materials Science, Testing and Informatics III
(p505)
Username:
Password: