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Silicon Carbide

Total: 4 pages; 32 titles
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  • Defects and Diffusion in Semiconductors - an Annual Retrospective VIII
    This eighth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective VII (Volumes 230-232) and the end of 2005 (allowing for vagaries of journal availability).
  • Diffusion in Silicon - A Seven-Year Retrospective
    This collection of abstracts of experimental and theoretical papers on the subject of diffusion in silicon is intended to complement earlier volumes (DDF153-155) which covered the previous decade’s work on the same topic.
  • Advances in Abrasive Technology V
    The history of abrasive technology dates from the very dawn of mineral utilization and continues to this day with the development of precision-finishing technology.The current requirements of high precision and high quality surfaces for critical components and devices, such as silicon wafers in the semiconductor industry, lenses in the precision optics industry, and dies in the injection molding industry, make the technology of abrasives more important than ever, and essential, albeit indirectly, for the rapid development of information technology. This book therefore plays a valuable role in presenting recent advances in the field of abrasive technology.
  • Advanced Materials Forum I
    This First International Materials Symposium in Portugal was organised in order to provide a forum within which material scientists and engineers, drawn from a very wide range of specialties, could present and discuss new research findings and compare points of view concerning advanced materials.
  • Fractography of Advanced Ceramics
    The aim of this book is to contribute to the development of new functional and structural ceramic materials, exhibiting enhanced performances and having improved lifetimes and reliability, by fostering a better understanding of their deterioration and failure mechanisms under various stress conditions and at various operating temperatures. The publication covers the topics of basic failure phenomena; indentation fracture; fracture and fractography of structural, electro- and bio- ceramics; fracture of fiber-reinforced composites; fracture of porous and laminated ceramics; defect - strength and microstructure - fracture toughness relationships; and damage mechanisms in nanoceramics.
  • Defects and Diffusion in Ceramics
    This latest volume of the annual series contains over 900 selected abstracts of research in the field of ceramics (including, for this purpose, allotropes of carbon); reported between the appearance of Retrospective IV and about June 2003 (allowing for variations in publication dates).
  • Defects and Diffusion in Ceramics
    In addition to the usual abstracts of research reported since the previous retrospective, this issue comprises ten invited papers. The first four are reviews that cover the important topics of conductive oxide preparation, the modeling of amorphous materials (silicon carbide, for example), the nanoscale characterization of oxides and the effect of combined irradiation treatments. The other six invited papers present recent experimental or theoretical studies of structural defects in gallium nitride, atomic-scale deformation processes in nanomaterials, micropipes in silicon carbide, radiation effects in garnets and boron diffusion in hafnia.
  • Ultra Clean Processing of Semiconductor Surfaces VIII
    This collection of 86 peer-reviewed papers covers all aspects of the use of ultra-clean technology for large-scale integration on semiconductors, and cleaning and contamination-control in both front-end-of-line (FEOL) and back-end-of-line (BEOL) processing.
  • Gettering and Defect Engineering in Semiconductor Technology XI
    This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at “La Badine” at the Giens peninsula south of France.
  • Ultra Clean Processing of Silicon Surfaces VII
    This book is sub-divided into 10 different topical sections; each dealing with important issues in surface cleaning and preparation.