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Articles by keyword: «Anneal»

• 1kV 4H-SiC JBS Rectifiers Fabricated Using an AlN Capped Anneal
  Published in: Silicon Carbide and Related Materials - 2002 (p843)
• Boron Diffusion in Pre-Amorphised Silicon: Interactions with the End of Range Defects
  Published in: Diffusion in Silicon (p11)
• Damage Relaxation Pre-Activation Anneal in Al-Implanted SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p617)
• Defect Studies in Semiconductors
  Published in: Positron Annihilation - ICPA-12 (p52)
• Differential Interference Contrast Microscopy of Defects in As-Grown and Annealed Si Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p387)
• Effect of Annealing on Microstructure and Properties for Semi-Solid Magnesium Strips
  Published in: Physical and Numerical Simulation of Material Processing VI (p581)
• Effect of Heat Treatment on Electrical Properties of Polycrystalline CuInSe₂ Thin Films Prepared by Two Methods
  Published in: Polycrystalline Semiconductors III (p521)
• Effect of Thermal Annealing on Electrical Degradation Characteristics of Sb₂O₃-Bi-Mn-Co-Doped ZnO Varistors
  Published in: Asian Ceramic Science for Electronics III and Electroceramics in Japan XII (p525)
• Effects of Activation Annealing on Thermally Stimulated Current in Semi-Insulating LEC GaAs Substrates
  Published in: Defects in Semiconductors 18 (p243)
• Enhanced Diffusion in Nonstoichiometric AlAs/GaAs Heterostructures
  Published in: Diffusion in GaAs and other III-V Semiconductors (p1)
• Excellent Surface Passivation by Silicon Dioxide Grown with a Electrochemical Method
  Published in: Energy, Environment and Biological Materials (p48)
• High Temperature Implant Activation in 4H and 6H-SiC in a Silane Ambient to Reduce Step Bunching
  Published in: Silicon Carbide and Related Materials - 1999 (p901)
• In-Line Phase and Texture Control in Microelectronics Industry
  Published in: Textures of Materials - ICOTOM 14 (p1343)
• Interface Properties of 4H-SiC/SiO₂ with MOS Capacitors and FETs Annealed in O₂, N₂O, NO and CO₂
  Published in: Silicon Carbide and Related Materials 2003 (p1309)
• Optimization of Poly-Silicon Deposition Process for Semiconductor Bridge
  Published in: Advanced Manufacturing Systems (p92)