Authors: Jun Kojima, Emi Makino, Yuichiro Tokuda, Naohiro Sugiyama, Norihiro Hoshino, Hidekazu Tsuchida
Abstract: This article gives the results of crystal growth by a High-Temperature Gas Source Method such as HTCVD. It was reported that clusters were formed and were an important factor of the growth in HTCVDs, and some influences of them were investigated. The difference between the model with and without clustering was compared. The experimental growth rates corresponded to the cluster model, and this indicated that clusters affect the crystal growth. Relations between the experimental growth rate and the growth temperature as a function of gas flow ratio were investigated. The gas flow ratio was defined: (SiH4+C3H8) / (SiH4+C3H8+H2). Maximum growth rate was 2.3mm/h under high source gas ratio. At present, a Φ75mm×54mm sized ingot has been developed.
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Authors: Kazuma Eto, Tomonori Miura, Tomohisa Kato, Hajime Okumura
Abstract: We found that the polarity of the 4H-SiC is reversed from Si-face to C-face by high Al doping during the physical vapor transport (PVT) growth. KOH etching and deep ultraviolet (DUV) Raman spectroscopy were used to confirm the polarity of the grown crystals. The results show the polarity inversion is occurred in the samples grown on Si-face SiC with using Al doped SiC source material.
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Authors: Dominik Rankl, Valdas Jokubavicius, Mikael Syväjärvi, Peter J. Wellmann
Abstract: We have investigated the growth of 3C-SiC using sublimation growth in the temperature range from 1800°C to 1950°C. The supersaturation was determined using numerical modeling of the temperature field and gas phase composition by applying quasi-equilibrium thermodynamic conditions. Analysis of the 3C-SiC yield was carried out by optical microscopy, optical absorption, Raman spectroscopy and x-ray analysis. Quantitative data on supersaturation are compared with most stable 3C-SiC nucleation and growth condition. Finally the application to large area growth in a physical vapor transport growth reactor is briefly addressed.
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Authors: Norihiro Hoshino, Isaho Kamata, Yuichiro Tokuda, Emi Makino, Jun Kojima, Hidekazu Tsuchida
Abstract: Possibilities of very fast 4H-SiC crystal growth using a high-temperature gas source method are surveyed by computational simulation and experimental studies. The temperature range suitable to obtain high growth rates are investigated by simulating temperature dependences of growth rates for H2+SiH4+C3H8 and H2 +SiH4+C3H8+HCl gas systems. Simulation and experimental results demonstrate that an increase in source gas flow rates as well as gas-flow velocities enhance growth rates. High growth rates exceeding 1 mm/h are experimentally obtained using both gas systems. Single crystal growth on a 3-inch diameter seed crystal is also demonstrated.
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Authors: Didier Chaussende, Kanaparin Ariyawong, Nikolaos Tsavdaris, Martin Seiss, Yun Ji Shin, Jean Marc Dedulle, Roland Madar, Eirini Sarigiannidou, Joseph La Manna, Odette Chaix-Pluchery, Thierry Ouisse
Abstract: In this paper, an overview of the SiC bulk growth processes is given with a special focus on the most recent results related to growth and modeling. In addition, even if SiC growth is a very old topic and that it is now considered as an « industrial development problem », we will show that there are still many open questions of both fundamental and technological importance related to its crystal growth. Process chemistry and surface mechanisms will be more specifically discussed.
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Authors: Isaho Kamata, Norihiro Hoshino, Yuichiro Tokuda, Emi Makino, Jun Kojima, Hidekazu Tsuchida
Abstract: This paper reports on evidence of high-quality and very fast 4H-SiC crystal growth achieved using a high-temperature gas source method. The formation of threading screw dislocations (TSDs) during crystal growth was examined by comparing synchrotron X-ray topography images taken for a seed and grown crystals, while the generation of a high density of new TSDs is observed under improper growth condition. High-quality crystal growth retaining the TSD density of the seed crystal was accomplished under an improved condition, even for a very high growth rate of 2.1 mm/h.
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Authors: Hidekazu Tsuchida, Isaho Kamata, Masahiko Ito, Tetsuya Miyazawa, Norihiro Hoshino, Hiroaki Fujibayashi, Hideki Ito, Masami Naitou, Hirofumi Aoki, Koichi Nishikawa, Emi Makino, Yuichiro Tokuda, Jun Kojima
Abstract: This paper introduces our recent challenges in fast 4H-SiC CVD growth and defect reduction. Enhanced growth rates in 4H-SiC epitaxial growth by high-speed wafer rotation and in a high-temperature gas source method promoting SiC bulk growth by increasing the gas flow velocity are demonstrated. Trials and results of deflecting threading dislocations by patterned C-face 4H-SiC epitaxial growth are also shown.
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Authors: Yuichiro Tokuda, Jun Kojima, Kazukuni Hara, Hidekazu Tsuchida, Shoichi Onda
Abstract: Our latest results of SiC bulk growth by High-Temperature Gas Source Method are given in this paper. Based on Mullins-Sekerka instability, optimal growth conditions to preclude dendrite crystals, which are one of the pending issues for high-speed bulk growth, was studied. First, the simulation studies showed that high temperature gradient in a growing crystal is required for high-speed bulk growth without dendrite crystals. Second, high-speed bulk growth was demonstrated under high temperature gradient.
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Authors: Motohisa Kado, Hironori Daikoku, Hidemitsu Sakamoto, Hiroshi Suzuki, Takeshi Bessho, Nobuyoshi Yashiro, Kazuhiko Kusunoki, Nobuhiro Okada, Kouji Moriguchi, Kazuhito Kamei
Abstract: In this study, we have investigated the rate-limiting process of 4H-SiC solution growth using Si-Cr based melt, and have tried high-speed growth. It is revealed that the rate-limiting process of SiC growth under our experimental condition is interface kinetics, which can be controlled by such factors as temperature and supersaturation of carbon. By enhancing the interface kinetics, SiC crystal has been grown at a high rate of 2 mm/h. The FWHM values of X-ray rocking curves and threading dislocation density of the grown crystals are almost the same as those of seed crystal. Possibility of high-speed and high-quality growth of 4H-SiC has been indicated.
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Authors: H. Tsuge, S. Ushio, S. Sato, M. Katsuno, T. Fujimoto, T. Yano
Abstract: For bulk growth of SiC crystal with higher quality, it is important to control the temperature distribution inside the crucible. We have performed numerical calculations of the temperature distribution inside the growing crystal, and discussed the relationship between the calculated sheer stress and the basal plane dislocation densities. We found that growth with lower basal plane dislocation defect densities, specifically at the front edge of the crystal, is possible by lowering the temperature gradient toward the growth direction.
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