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Articles by keyword: «CV»

• Carrier Removal in Electron Irradiated 4H and 6H SiC
  Published in: Silicon Carbide and Related Materials 2007 (p425)
• C-V - and DLTS-Investigations of Pyramid-Shaped Ge Quantum Dots Embedded in N-Type Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p72)
• Effect of Chemical Oxides Formed During Pre-Gate Oxide Cleaning on the Properties of Sub 20Ǻ Thick Ultra-Thin Stack Gate Dielectrics
  Published in: Ultra Clean Processing of Silicon Surfaces V (p165)
• Electrical Properties of Aluminium Oxide Films Grown by Atomic Layer Deposition on n-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p705)
• Electrodeposition of Nanocrystalline CoNiFe Thin Films Prepared by Cyclic Voltammetry
  Published in: Eco-Materials Processing and Design X (p731)
• High Temperature Annealing Study of Al₂O₃ Deposited by ALCVD on n-Type 4H-SiC
  Published in: Silicon Carbide and Related Materials 2005 (p1067)
• Low-Temperature Performance of the Li[Li_0.2Co_0.4Mn_0.4]O₂ Cathode Material Studied for Li-Ion Batteries
  Published in: Renewable and Sustainable Energy (p3662)
• Mapping on Bulk and Epitaxy Layer 4H-SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p431)
• Mechanism for the Formation of Elemental Sulfur from Modified Stretford Process
  Published in: Fundamental of Chemical Engineering (p892)
• Steam Annealing Effects on CV Characteristics of MOS Structures on (11-20) Face of 4H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p635)
• The Al₂O₃/4H-SiC Interface Investigated by Thermal Dielectric Relaxation Current Technique
  Published in: Silicon Carbide and Related Materials 2006 (p537)
• The Ferroelectric and Electrical Properties of CaBi₄Ti₄O₁₅ Thin Films Prepared by Sol-Gel Technology
  Published in: Advanced Materials (p891)