Keyword: "Carrier Lifetime"
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15 kV, Large Area (1 cm2), 4H-SiC p-Type Gate Turn-Off Thyristors

Authors: Lin Cheng, Anant K. Agarwal, Craig Capell, Michael O'Loughlin, Khiem Lam, Jon Zhang, Jim Richmond, Al Burk, John W. Palmour, Aderinto A. Ogunniyi, Heather K. O'Brien, Charles J. Scozzie

978

16 kV, 1 cm2, 4H-SiC PiN Diodes for Advanced High-Power and High-Temperature Applications

Authors: Lin Cheng, Anant K. Agarwal, Michael O'Loughlin, Craig Capell, Khiem Lam, Charlotte Jonas, Jim Richmond, Al Burk, John W. Palmour, Aderinto A. Ogunniyi, Heather K. O'Brien, Charles J. Scozzie

895

Analysis of Non-Uniform Contamination Profiles by Lifetime Data

Authors: Maria Luisa Polignano, Domenico Caputo, Giuseppe Pavia, F. Zanderigo

413

Beryllium-Implanted 6H-SiC P+N Junctions

Authors: Nudjarin Ramungul, Yan Jun Zheng, R. Patel, V. Khemka, T. Paul Chow

1049

Carrier Lifetime Analysis by Microwave Photoconductive Decay (μ-PCD) for 4H SiC Epitaxial Wafers

Authors: Gil Yong Chung, Mark J. Loboda, Mike F. MacMillan, Jian Wei Wan, Darren M. Hansen

323

Carrier Lifetime Extraction from a 6H-SiC High Voltage p-i-n Rectifier Reverse Recovery Waveform

Authors: Nudjarin Ramungul, V. Khemka, T. Paul Chow, Mario Ghezzo, James W. Kretchmer

1065

Carrier Lifetime Studies in Diode Structures on Si Substrates with and without Ge Doping

Authors: Aurimas Uleckas, Eugenijus Gaubas, Joan Marc Rafi, Jiahe Chen, De Ren Yang, Hidenori Ohyama, Eddy Simoen, Jan Vanhellemont

347

Characterisation and Defects in Silicon Carbide

Authors: Peder Bergman, H. Jakobsson, L. Storasta, F.H.C. Carlsson, Björn Magnusson, S.G. Sridhara, G.R. Pozina, H. Lendenmann, Erik Janzén

9

Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay

Authors: R.J. Kumar, Peter A. Losee, Can Hua Li, Joseph Seiler, I. Bhat, T. Paul Chow, J.M. Borrego, Ronald J. Gutmann

405

Characterization of Annealed HPSI 4H-SiC for Photoconductive Semiconductor Switches

Authors: Cameron Hettler, William W. Sullivan III, James Dickens

301

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