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Articles by keyword: «Cathodoluminescence»

• (1 - 3) MeV / amu Heavy Ion Irradiaiton Effects on Optical Properties of Al₂O₃
  Published in: Materials Science Applications of Ion Beam Techniques (p399)
• 3-D Mapping of Strain and Defects in a ZnSE Epilayer Using a Variable Energy Electron Beam
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p163)
• A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p1599)
• A Positron Annihilation Study of Defects in ZnO and Their Relation to Luminescence Centers
  Published in: Defects in Semiconductors 17 (p465)
• Advanced Evaluation Methods of Residual Stress in Bioceramics Wear Surfaces
  Published in: 12th INTERNATIONAL CERAMICS CONGRESS PART C (p43)
• Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope
  Published in: Advances in Ceramic Materials (p93)
• Analysis of Silicon Carbide and Silicon Nitride Precipitates in Block Cast Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p41)
• Annealing in a Natural Laboratory: an EBSD and Cl Study of Calcite and Quartz Growth from Volumes of Rock Heated by a Nearby Melt Intrusion
  Published in: Fundamentals of Deformation and Annealing (p333)
• Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p57)
• Carbon as a Probe of Edge-Defined Film-Fed Growth Silicon
  Published in: Defects in Semiconductors 17 (p1493)
• Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM
  Published in: Electron Microscopy XIV (p20)
• Cathodoluminescence as a Method of Microstructure Characterization of Biphasic Ceramics Composed of Hydroxyapatite and β-Tricalcium Phosphate
  Published in: Bioceramics 17 (p333)
• Cathodoluminescence Dependence on Beam Generation Conditions and Surface Properties of Materials
  Published in: Beam Injection Assessment of Defects in Semiconductors (p243)
• Cathodoluminescence Depth Profiling of Ge-Implanted SiO₂ Layers
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p119)
• Cathodoluminescence from Nanocrystalline Silicon Films in the Scanning Electron Microscope
  Published in: Beam Injection Assessment of Defects in Semiconductors (p191)