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Articles by keyword: «Cavities»

• 2D-ACAR Investigations of PPT Aramid Fibres
  Published in: Positron Annihilation - ICPA-12 (p322)
• A TEM Study of Cavity Structures in a Fe-Cr-Mn Alloy and a 316L Stainless Steel Heavily Irradiated with 92 MeV Ar Ions
  Published in: PRICM-5 (p1459)
• Binding of Copper to Nanocavities in Silicon
  Published in: Defects in Semiconductors 17 (p1635)
• Cavity Formation in Helium-Implanted Silicon - Temperature Dependence
  Published in: Defects and Diffusion in Semiconductors (p37)
• Defect Engineering for SIMOX Processing
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p339)
• Defects Created by Multi-Energy He Implantation of Silicon at High Temperatures
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p319)
• Deformation Behavior of Fine Grained Al-Mg Alloy under Biaxial Stress
  Published in: Nanomaterials by Severe Plastic Deformation (p475)
• Effect of Non-Uniform Temperature Field on Piece Rolled by Three-Roll Cross Wedge Rolling
  Published in: e-Engineering & Digital Enterprise Technology VII (p456)
• Evolution of Ar Implanted Amorphous Silicon Dioxide under High Voltage Electron Beam
  Published in: Solid-Solid Phase Transformations in Inorganic Materials (p697)
• Influence of Depth in Helium Desorption from Cavities Induced by ³He Implantation in Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p303)
• Ion Beam Induced Excess Vacancies in Si and SiGe and Related Cu Gettering
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p587)
• Luminescence from Si Nanocrystals and Er³⁺ Ions Embedded in Resonant Cavities
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p617)
• Numerical Study on the Fracture Evolution around Cavities in Rock
  Published in: Advances in Fracture and Strength (p2598)
• Plasma Nitriding of Deep Narrow Cavities
  Published in: Materials Structure & Micromechanics of Fracture VI (p267)
• Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium
  Published in: Positron Annihilation - ICPA-13 (p254)