HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Cleaning»

• Angle Resolved XPS Characterization of the Formation of Cl and Br Bonds in Poly-Silicon Etching and Its Cleaning
  Published in: Ultra Clean Processing of Silicon Surfaces IV (p153)
• Angled XPS Analysis of Low-k Dielectric Surfaces after Cleaning
  Published in: Ultra Clean Processing of Silicon Surfaces VII (p331)
• Automatic Wool Washing Machine Design and Research
  Published in: Emerging Systems for Materials, Mechanics and Manufacturing (p377)
• Behaviour of High-k Dielectric Materials with Classical Cleaning Chemistries
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p15)
• Central Air-Conditioning Duct Cleaning System Based on SRV1
  Published in: Mechanical and Electronics Engineering III (p3916)
• Characterization of a Cavitation Bubble Structure at 230 kHz: Bubble Population, Sonoluminescence and Cleaning Potential
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p11)
• Cleaning of Silicon Surfaces for Nanotechnology
  Published in: Rapid Thermal Processing and beyond: Applications in Semiconductor Processing (p77)
• Cleaning Technique Using High-Speed Steam-Water Mixed Spray
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p43)
• CMP Behavior of α-Alumina-g-Polyvinylpyrrolidone Composite Abrasive on Hard Disk Substrate
  Published in: Manufacturing Science and Engineering I (p2135)
• Comparison of Gold Particle Removal from Fused Silica and Thermal Oxide Surfaces in Dilute Ammonium Hydroxide Solutions
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p159)
• Comparison of Laser Cleaning of Al₂O₃ and CBN Grinding Wheels
  Published in: Advances in Abrasive Technology VI (p365)
• Confined Chemical Cleaning: A Novel Concept Evaluated for Front End of Line Applications
  Published in: Ultra Clean Processing of Semiconductor Surfaces VIII (p121)
• Contamination and Cleaning of GaAs-(100) Surfaces
  Published in: Defects in Semiconductors 18 (p1967)
• Cu Surface Characterization after Wet Cleaning Processes
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p371)
• Dry Cleaning of Organic Contamination on Silicon Wafers Using Rapid Optical Surface Treatment
  Published in: Ultra Clean Processing of Silicon Surfaces V (p59)