Papers by Keyword: Co/Pd

Abstract: Co/Pd magnetic multilayers have been prepared by using a sputtering method. Lattice distances and magnetic hysteresis curves have been measured by X-ray diffraction (XRD) measurements and magnetization measurements using a vibrating sample magnetometer (VSM). The XRD measurements have shown that the samples with thinner Pd layers have shorter lattice distances, and the VSM measurements have shown that the samples of thinner Co and thicker Pd layers are closer to those of perpendicular magnetic anisotropy. We have applied the X-ray magnetic diffraction method to the Co/Pd multilayer for the first time and have succeeded in observing a change in the X-ray diffraction intensities by the reversal of the magnetization direction.

Abstract: We compare two Co/Pd multilayers with correspondingly smooth and rough interfaces. The first is a Co (1.5 nm)/Pd (2.6 nm) multilayer with a smooth interface deposited by the MBE technique, and the second is a Co (1.6 nm)/Pd (4.0 nm) multilayer with a rough interface deposited by the sputter technique. Both multilayers have almost the same perpendicular magnetic anisotropy energy, 1.15 Merg/cc for the Co (1.5 nm)/Pd (2.6 nm) multilayer and 1.20 Merg/cc for the Co (1.6 nm)/Pd (4.0 nm) multilayer, respectively. The symmetry of the wave function, which is measured using the magnetic Compton profile, is almost the same for both multilayers. This suggests that the smooth interface controls the wave function and enhances the PMA energy even if the Co/Pd multilayer has a thinner Pd layer.