Papers by Keyword: Complex Defect

Abstract: In the signal processing method, envelope analysis is a useful method to evaluate the rolling element bearing problems and Wavelet transform is a powerful method to detect faults occurred on gearboxes. However, exact method for AE signal is not developed yet. Therefore, in this paper, two methods, which are Hilbert Transform (HT) and Hilbert-Huang transforms (HHT), will be compared for development a signal processing method for early fault detection system by using AE. HHT has better advantages than HT because HHT can show the time-frequency domain result. But, HHT needs long time to process a signal, which has a lot of data, and has a disadvantage in de-noising filter.

Abstract: The defects produced by 7.0 MeV C+ irradiation in 4H-SiC epitaxial layer were followed by Deep Level Transient Spectroscopy, current-voltage measurements and Transmission Electron Microscopy in a large fluence range (109-51013 ions/cm2). At low fluence (109 -1010 ions/cm2), the formation of three main level defects located at 0.68 eV, 0.98 eV and 1.4 eV below the conduction band edge is detected. The trap concentration increases with ion fluence suggesting that these levels are associated to the point defects generated by ion irradiation. In this fluence range the leakage current of the diodes does not change. At higher fluence an evolution of defects occurs, as the concentration of traps at 0.68 eV and 1.4 eV decreases, while the intensity of the level at 0.98 eV remains constant. In this fluence range complex defects are formed and an increase of a factor five in the leakage current is measured.