HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Compound Semiconductor»

• 35 Years of Defects in Semiconductors: What Next?
  Published in: Defects in Semiconductors 17 (p9)
• Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scannig Tunneling Microscopy
  Published in: Defects in Semiconductors 18 (p1949)
• Development of Electrode Materials for Semiconductor Devices
  Published in: PRICM-5 (p1705)
• Electronic Structure in Semiconductors Studied by Two Dimensional Angular Correlation of Positron Annihilation Radiations
  Published in: Positron Annihilation - ICPA-9 (p493)
• Interactions of Impurities with Dislocations: Mechanical Effects
  Published in: Defect Interaction and Clustering in Semiconductors (p145)
• Investigations of the High Field Electron Transport Characteristics in Bulk GaAs and InP
  Published in: Ultrafast Phenomena in Semiconductors (p279)
• Investigations of Vacancy Defects in CdTe by Means of Positron Annihilation
  Published in: Positron Annihilation - ICPA-10 (p473)
• Ion Assisted Reactive Magnetron Sputtering as a Deposition Method for High Quality Thin Films of Compound Semiconductors
  Published in: Polycrystalline Semiconductors V (p261)
• Metastable Defects in Compound Semiconductors
  Published in: Special Defects in Semiconducting Materials (p73)
• Point Defect Assisted Diffusion in Semiconductors
  Published in: Special Defects in Semiconducting Materials (p23)
• Point Defects in GaP Studied by Correlated Positron Lifetime and Hall Measurements
  Published in: Positron Annihilation - ICPA-9 (p1173)
• Point Defects in III-V Compound Semiconductors
  Published in: Defects and Diffusion in Semiconductors (p85)
• Prospects for New Wafer Types and Materials in Semiconductor Technology and Factors for their Successful Introduction
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p665)
• Scanning Probe Microscopy Imaging before and after Atomic Layer Oxide Deposition on a Compound Semiconductor Surface
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p9)
• Theoretical Study of the Atomic and Electronic Structures of Grain Boundaries in Semiconductors
  Published in: Polycrystalline Semiconductors III (p55)