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Articles by keyword: «Contrast»

• A SiO₂-ZrO₂ Gel Film Doped with Organic Pigments Made by the Sol-Gel Method for Contrast Enhancement of Color Picture Tubes
  Published in: Sol-Gel Production (p67)
• An Adaptive Global LED Backlight Dimming for Contrast Enhancement and Power Reduction
  Published in: Liquid Crystals and Related Materials II (p241)
• An Embedded Infrared Image Enhancement System Based on DSP and FPGA
  Published in: Manufacturing Engineering and Process (p263)
• An Improved Algorithm to Near Infrared Multispectral Ice Detection
  Published in: Frontiers of Manufacturing and Design Science II (p4367)
• Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities
  Published in: Polycrystalline Semiconductors IV (p51)
• Contrast Research on Cutting Forces in 4-Axis and 5-Axis Blade Machining Process
  Published in: Advanced Design and Manufacturing Technology I (p209)
• Development of Cylinder with Multiple Diagonal Slits for Ultrasonic Longitudinal - Torsional Vibration Turn-Milling
  Published in: Manufacturing Engineering and Automation I (p2291)
• Experimental Investigation Contrast to Coal Dust and FS Powder Application
  Published in: Advanced Materials and Processes (p2063)
• Highway Tunnel Comprehensive Detection Technology Research and the Application
  Published in: Progress in Civil Engineering (p1601)
• Infrared Thermal Wave Quantitative Evaluation for Fiber Reinforced Composites
  Published in: Materials Modeling, Simulation, and Characterization (p377)
• Monte Carlo Simulation of Projection Electron Beam Lithography
  Published in: Nanoscience and Technology (p1097)
• Photoacoustic Imaging Based on Limited-Aperture of Transducer
  Published in: Advanced Materials Research II (p1346)
• Robust Adaptive Beamforming Imaging Approach for Stepped-Frequency through-the-Wall Radar
  Published in: Mechanical and Electronics Engineering III (p45)
• Simulation of XBIC Contrast of Precipitates in Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p247)
• XBIC Investigation of the Grain Boundaries in Multicrystalline Si on the Laboratory X-Ray Source
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p226)