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Articles by keyword: «Critical Thickness»

• A Theoretical Calculation of Misfit Dislocation and Strain Relaxation in Step-graded In_xGa _1-x N/GaN Layers
  Published in: MEMS, NANO and Smart Systems (p456)
• Calculations of Equilibrium Critical Thickness for Non-Polar Wurtzite InGaN/GaN Systems
  Published in: Materials Structure & Micromechanics of Fracture V (p209)
• Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p147)
• Crystal-to-Glass Transition in Interface Controlled Materials
  Published in: Metastable, Mechanically Alloyed and Nanocrystalline Materials (p127)
• Dsilocations in MBE-Grown ZnSe/GaAs(001) Epitaxial Layers
  Published in: Defects and Diffusion in II-VI Compounds (p31)
• Equilibrium Critical Thickness of Strained Buried SiGe Layers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p149)
• Isotropic and Anisotropic Elasticity Studies of Mismatch Dislocations, Critical Thickness and Work Hardening in Epilayers
  Published in: Defect and Diffusion Forum Vols. 136-137 (p61)
• Misfit Dislocation Generation from Dissociated Threading Dislocations in Strained-Layer Heterostrutures
  Published in: Interfaces II (p279)
• Model Analysis of Friction Coefficient Varied with Sulfide Layer Thickness on Hard Steel Surface
  Published in: Materials Processing Technologies (p61)
• On the Reduction of the Critical Thickness in In_xGa_1-xAs Quantum Well Layers Grown on Vicinal GaAs Substrates
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p449)
• Origination and Properties of Dislocations in Thin Film Nitrides
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p39)
• Strain and Relaxation in ZnSe/CdSe Superlattices
  Published in: Defects in Semiconductors 17 (p1617)
• Strain Relaxation in (CdMg)Te Layers Grown by Molecular Beam Epitaxy
  Published in: II-VI Compounds and Semimagnetic Semiconductors (p255)
• Study on Grinding Technology of Granite Thin Slab
  Published in: Advances in Materials Processing X (p281)
• TEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p375)