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Articles by keyword: «Crystal Defect»

• Computational Evaluation of Electrical Conductivity on SiC and the Influence of Crystal Defects
  Published in: Silicon Carbide and Related Materials 2007 (p497)
• Defects Below Mask Edges in Silicon Induced by Amorphizing Implantations
  Published in: Defect and Diffusion Forum Vols. 148-149 (p103)
• Effect of Crystal Defects in FeNiC Alloys on Subsequent Martensitic Transformation
  Published in: Defect and Diffusion Forum Vols. 148-149 (p165)
• Electrical Impact of SiC Structural Crystal Defects on High Electric Field Devices
  Published in: Silicon Carbide and Related Materials - 1999 (p1161)
• Improvement of Schottky Contact Characteristics by Anodic Oxidation of 4H-SiC
  Published in: Silicon Carbide and Related Materials 2010 (p461)
• Investigation of Crystal Defects in Epitaxial Layers on Nitrogen-Doped Substrates and a Method for their Suppression
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p11)
• Melt Growth of Semiconductors
  Published in: Theoretical and Technological Aspects of Crystal Growth (p87)
• Micromechanism of Plastic Deformation on Elastic Modulus
  Published in: Progress in Light Metals, Aerospace Materials and Superconductors (p713)
• Multi-Level Simulation Study of Crystal Growth and Defect Formation Processes in SiC
  Published in: Silicon Carbide and Related Materials 2007 (p131)
• Negative Field Reliability of ONO Gate Dielectric on 4H-SiC
  Published in: Silicon Carbide and Related Materials 2007 (p795)
• Potential and Limitations of Electron Holography in Silicon Research
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p603)
• Pressure Effect in Sublimation Growth of Bulk SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p83)
• Prevention of Condensation Defects on Contact Patterns by Improving Rinse Process
  Published in: Ultra Clean Processing of Semiconductor Surfaces IX (p151)
• Reverse Electrical Characteristics of 4H-SiC JBS Diodes Fabricated on In-House Substrate with Low Threading Dislocation Density
  Published in: Silicon Carbide and Related Materials 2010 (p694)
• Structural Defects in Crystals and Techniques for Their Detection
  Published in: Theoretical and Technological Aspects of Crystal Growth (p291)