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Articles by keyword: «Crystal Defects»

• Dislocation Generation in Device Fabrication Process
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p439)
• Forced Vapour-Phase Decomposition (FVPD) in Combination with e.g. TXRF - a Method to Determine Contamination in Silicon
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p171)
• Gettering Behavior of Transition Metals in Low Energy, High Dose Ion Implanted Silicon
  Published in: Ultra Clean Processing of Semiconductor Surfaces X (p283)
• Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p249)
• In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC
  Published in: Silicon Carbide and Related Materials 2006 (p267)
• Luminescence of Silicon Implanted with Phosphorus
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p289)
• Relation between Surface Contamination of Metals and Defect Formation in Si during Oxidation of Bulk- and SOI-Wafers
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p93)
• Status of Large Diameter SiC Single Crystals
  Published in: Silicon Carbide and Related Materials 2011 (p3)
• Twist Anle Dependence of Interfacial Fracture Toughness of (0001) Twist Boundary of Alumina
  Published in: The Science of Engineering Ceramics II (p573)
• Two-Dimensional Clusters of Bubbles
  Published in: Advanced Materials Forum I (p648)
• X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p287)