Keyword: "DLTS"
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A Deep Erbium-Related Bandgap State in 4H Silicon Carbide

Authors: G. Pasold, F. Albrecht, Joachim Grillenberger, Ulrike Grossner, C. Hülsen, R. Sielemann, W. Witthuhn

487

A Sharp Defect-Annealing Stage Below Room Temperature in Irradiated N-Type Indium Phosphide

Authors: A. Canimoglu, D.W. Palmer

837

A Study of Deep Energy-Level Traps at the 4H-SiC/SiO2 Interface and Their Passivation by Hydrogen

Authors: Fredrik Allerstam, Einar Ö. Sveinbjörnsson

755

A Study of the Copper-Pair Related Centers in Silicon

Authors: Andrei A. Istratov, T. Heiser, H. Hieslmair, C. Flink, Joachim Krüger, Eicke R. Weber

467

About the Electrical Properties of Oxygen Phases Segregated by Annealing Cz Silicon in the 600-800°C Range

Authors: Eugene B. Yakimov, Olga V. Feklisova, Maurizio Acciarri, Anna Cavallini, Sergio Pizzini

327

Alpha Radiation-Induced Deep Levels in p-InP

Authors: Aurangzeb Khan, Umar S. Qurashi, N. Zafar, M. Zafar Iqbal, Armin Dadgar, D. Bimberg

843

Analysis of Radiation-Induced Defects in InGaP Materials and Solar Cells

Authors: Aurangzeb Khan

107

As-Grown and Process-Related Defects in Schottky Barrier Diodes Fabricated on Bulk Off-Axis n-Type 6H-SiC

Authors: E. van Wyk, A.W.R. Leitch

697

Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron

Authors: K. Kobayashi, H. Ohyama, K. Hayama, Y. Takami, Eddy Simoen, A. Poyai, C. Claeys, A. Mohammadzadeh, S. Kohiki

357

Au-Related Deep States in the Presence of Extended Defects in N-Type Silicon

Authors: M. Kaniewska, J. Kaniewski, Anthony R. Peaker

1511

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