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Articles by keyword: «Deep Traps»

• 4H-SiC pn Diode Grown by LPE Method for High-Power Applications
  Published in: Silicon Carbide and Related Materials - 2002 (p867)
• Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p747)
• Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
  Published in: Silicon Carbide and Related Materials 2005 (p493)
• Deep Traps in High-Purity Semi-Insulating 6H-SiC Substrates: Thermally Stimulated Current Spectroscopy
  Published in: Silicon Carbide and Related Materials 2005 (p509)
• Halide-CVD Growth of Bulk SiC Crystals
  Published in: Silicon Carbide and Related Materials 2005 (p21)
• On the Interpretation of High-Frequency Capacitance Data of SiC MOS Structures: The Effect of Thermal Non-Equilibrium
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p981)
• Positron Trapping in Deformed Copper Down to Millikelvins
  Published in: Positron Annihilation - ICPA-13 (p96)
• Profiling the Deep Levels inSiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy
  Published in: Defects in Semiconductors 18 (p485)