Keyword: "Defect"
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[01-15] Grown 6H-SiC Bulk Crystals Investigated by High Energy Triple Axis X-Ray Diffraction

Authors: Christoph Seitz, Z.G. Herro, Boris M. Epelbaum, Albrecht Winnacker, Rainer Hock, Andreas Magerl

307

‘Super Fuzzy’ Feature Model for Defects Detection of Fabric Materials

Authors: Zhe Liu

872

Ab Initio Investigation of the Influence of Single Intrinsic Defect on the Structure, Bulk Moduli and Electronic Properties of V-Doped ZnO

Authors: Qing Bo Wang, Cui Zhou

15

100 mm 4HN-SiC Wafers with Zero Micropipe Density

Authors: R.T. Leonard, Y. Khlebnikov, Adrian R. Powell, C. Basceri, M.F. Brady, I. Khlebnikov, Jason R. Jenny, D.P. Malta, Michael J. Paisley, Valeri F. Tsvetkov, R. Zilli, E. Deyneka, H.McD. Hobgood, Vijay Balakrishna, Calvin H. Carter Jr.

7

4H-SiC Device Scaling Development on Repaired Micropipe Substrates

Authors: T.E. Schattner, Jeff B. Casady, M.C.D. Smith, Michael S. Mazzola, Vladimir Dmitriev, S.V. Rentakova, Stephen E. Saddow

1203

4H-SiC High Temperature Spectrometers

Authors: Evgenia V. Kalinina, Nikita B. Strokan, Alexander M. Ivanov, A. Sadohin, A. Azarov, V. Kossov, R. Yafaev, S. Lashaev

941

6H-SiC Crystals Grown in [015] and [001] Directions Characterized by High Energy Triple-Axis X-Ray Diffraction

Authors: Matthias Stockmeier, Rainer Hock, Octavian Filip, Boris M. Epelbaum, Albrecht Winnacker, Andreas Magerl

219

A Combined Positron Microprobe - Scanning Electron Microscope for Positron-Annihilation Spectroscopy with a Spatial Resolution in the Micron Range

Authors: H. Greif, M. Haaks, U. Holzwarth, U. Männig, M. Tongbhoyai, Karin Maier

641

A Design of Online Leak Sealing Clamp for the Flange with Defects

Authors: Xiao Hui Yang, Jian Xin Tai, Rui Dian Lv, Lai Min San

836

A Direct Examination of the Fracture Strength-Defect Size Relationship in Alumina Ceramics

Authors: Y. Zhang, Nozomu Uchida, Kazuyoshi Uematsu, Tadashi Hotta, K. Nakahira, Masami Naito

269

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