HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Defect Engineering»

• Computer Simulation of Gettering Induced Oxygen Redistribution in SOI Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p273)
• Defect and Structure Engineering – Submicron Technology and Inverse Nanotechnology for Photo- and Ionizing Radiation Detectors
  Published in: Global Research and Education (p14)
• Defect Engineering and Prevention of Impurity Gettering at R_P/2 in Ion-Implanted Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p399)
• Defect Engineering for SIMOX Processing
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p339)
• Defect Engineering Radiation Tolerant Silicon Detectors
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p221)
• Defect Generation in Some Transition-Metal Silicides in Accommodating the Deviation from the Stoichiometric Compositions
  Published in: PRICM 6 (p443)
• Laser Scattering Tomography on Magnetic CZ-Si for Semiconductor Process Optimization
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p597)
• Orthogonal Defect Solutions for Silicon Crystal Growth and Wafer Processing
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p9)
• Processing-Induced Defects in Epitaxially Grown p- and n-Type SiGe
  Published in: Defects and Diffusion in Semiconductors IV (p161)
• Towards the Tailoring of P Diffusion Gettering to As-Grown Silicon Material Properties
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p158)
• Vacancy Engineering – An Ultra-Low Thermal Budget Method for High-Concentration 'Diffusionless' Implantation Doping
  Published in: Rapid Thermal Processing and beyond: Applications in Semiconductor Processing (p295)
• Vacancy-Gettering in Silicon: Cavities and Helium-Implantation
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p229)