HomeDefect Profiling

Papers by Keyword: Defect Profiling

Paper TitlePage

Positron Microprobes

Authors: Werner Triftshäuser

452

Defect Profiling with Pulsed e⁺-Beams

Authors: Gottfried Kögel

107

Ion Implantation Damage in Silicon Studied Using Slow Positrons, RBS and Infrared Absorption

Authors: P.J. Simpson, M. Vos, I.V. Mitchell, C. Wu, P.J. Schultz

1439

Annealing of Silicon Implantation Damage in Indium Phosphide

Authors: P.J. Simpson, U.G. Akano, P.J. Schultz, I.V. Mitchell

1435

Depth Profiling of Defects in Low Temperature MBE-Grown Silicon

Authors: T.E. Jackman, G.C. Aers, J.P. McCaffrey, D.T. Britton, P. Willutzki, P.J. Simpson, P.J. Schultz, Peter Mascher

301