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Articles by keyword: «Dielectric Spectroscopy»

• Analysis of Motion of the Domain and Phase Boundaries in the Process of Polarization and Polarization Reversal in Low-Coercive CTS-Based Ferroelectric Ceramics
  Published in: Euro Ceramics V (p1040)
• Anomalous Broad Dielectric Dispersion of 0.4PZN-0.3PSN-0.3PZN Relaxor Ceramics at Lower Temperatures
  Published in: Advanced Materials Forum III (p216)
• Application of Dielectric Spectroscopy in ZnO Varistor Ceramics
  Published in: Biotechnology, Chemical and Materials Engineering (p24)
• Carrier Transport Investigation on Organic Semiconductor by Electrical DC and AC Measurements: the Case of Alq₃
  Published in: Advanced Materials Forum III (p78)
• Effect of Confinement on the Freezing-Melting Dynamics of Water
  Published in: Advanced Materials Forum III (p1255)
• Effects of Orientation on the Segmental Dynamics of Natural Rubber
  Published in: Polymer Composite Materials: From Macro, Micro to Nanoscale (p57)
• Interfacial Electrochemistry of Bond Cement and Tubular Steel
  Published in: Sustainable Development of Urban Environment and Building Material (p53)
• Isothermal Dielectric Relaxations of Poly(vinylidene Fluoride) Filled with Silicon Carbide Nanoparticles
  Published in: Mechanics, Solid State and Engineering Materials (p49)
• Mechanical Spectroscopy and other Relaxation Spectroscopies
  Published in: Mechanical Spectroscopy II (p31)
• New Experimental Evidence of Relaxor Ferroelectrics
  Published in: Euro Ceramics V (p1064)
• Primary Study on Crop Wet Biomass Measuring with Dielectric Spectroscopy
  Published in: Manufacturing Science and Materials Engineering (p277)
• Relaxor-Like Behavior of Self-Polarized Pb(Zr,Ti)O₃ Thin Films
  Published in: Advanced Materials Forum III (p175)
• Spectroscopic and other Techniques for the Study of Ferroelectricity in Polymers
  Published in: Ferroelectric Polymers and Ceramic-Polymer Composites (p31)
• Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors
  Published in: Passivation of Metals and Semiconductors (p573)
• Suitable Characterization Methods and Insulating Materials for Devices Operating above 200 °C
  Published in: Advances in Innovative Materials and Applications (p229)