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Articles by keyword: «Donor»

• Carrier Localization in Gallium Nitride
  Published in: Defects in Semiconductors 18 (p31)
• Donor Concentration Dependence of GaP Luminescence
  Published in: Shallow Impurities in Semiconductors V (p375)
• Doping of Wide-Gap II-VI Compounds for Short-Wavelength Visible Light Emitting Devices
  Published in: Defects in Semiconductors 17 (p385)
• Effective-Mass-Like Excited Pseudo-Donor States of a Complex Metastable Defect in Silicon
  Published in: Shallow Impurities in Semiconductors V (p249)
• Electrical Properties of Sb-Doped BaPbO₃ Ceramics
  Published in: High-Performance Ceramics V (p653)
• Grain Growth Kinetics of Cobalt-Doped SnO₂ by Varying Nb₂O₅ Content
  Published in: Progress in Powder Metallurgy (p529)
• Hydrogen-Related Donors in Silicon: Centers with Negative Electronic Correlation Energy
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p229)
• Infrared Absorption Lines in Hydrogen-Plasma Treated Se-Doped GaAs
  Published in: Shallow Impurities in Semiconductors V (p309)
• Nitrogen Doping in Low-Temperature Halo-Carbon Homoepitaxial Growth of SiC
  Published in: Silicon Carbide and Related Materials 2007 (p159)
• Observation of Diffusion Behavior in Al-Implanted ZnO Single Crystal
  Published in: Asian Ceramic Science for Electronics III and Electroceramics in Japan XII (p197)
• Photoluminescence of Phosphorous Doped SiC
  Published in: Silicon Carbide and Related Materials 2005 (p589)
• Structure and Properties of Hydrogen-Charged Electrochromic Nb₂O₅ Ceramics
  Published in: Multi-Functional Materials and Structures II (p1619)
• The Effect of Rare Earth (Ln = Gd, Dy, Y and Yb) Doping on the Microstructure and Reliability in BaTiO₃-Based Monolithic Ceramic Capacitors (MLCs)
  Published in: Asian Ceramic Science for Electronics III and Electroceramics in Japan XII (p301)
• Ultrashallow Hydrogen-Like Thermal Donors in Silicon Crystals
  Published in: Shallow Impurities in Semiconductors V (p219)
• Vacancy- and Acceptor- H Complxes in Inp
  Published in: Defects in Semiconductors 18 (p969)