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Articles by keyword: «EBIC»

• 3-Dimensional Non-Destructive Dislocation Analyses in SiC Measured by Planar Electron-Beam-Induced Current Method
  Published in: Silicon Carbide and Related Materials 2005 (p423)
• Analysis of Electron-Beam Crystallized Large Grained Si Films on Glass Substrate by EBIC, EBSD and PL
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p116)
• Analysis of Silicon Carbide and Silicon Nitride Precipitates in Block Cast Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p41)
• Bipolar Degradation in 4H-SiC Thyristors
  Published in: Silicon Carbide and Related Materials 2011 (p1175)
• Carrier Recombination Activities and Structural Properties of Small-Angle Boundaries in Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p9)
• Challenging the Spatial Resolution Limits of CL and EBIC
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p19)
• Characterization of Stacking Fault-Induced Behavior in 4H-SiC p-i-n Diodes
  Published in: Silicon Carbide and Related Materials 2005 (p363)
• Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p61)
• Crystalline Silicon for Solar Cells
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p695)
• CVD Growth and Characterization of 4H-SiC Epitaxial Film on (11-20) As-Cut Substrates
  Published in: Silicon Carbide and Related Materials 2004 (p113)
• Defect Characterization of Poly-Ge and VFG-Grown Ge Material
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p483)
• Direct Observation of Asymmetry in the Barrier Structure of Zinc Oxide Varistors Using REBIC Microscopy
  Published in: Euro Ceramics VII (p1239)
• EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes
  Published in: Silicon Carbide and Related Materials 2008 (p707)
• EBIC and Cathodoluminescence Study of the Bonded Silicon Wafers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p481)
• EBIC and DLTS of the Electrical Activity of Fe-Contaminated Silicon Bicrystals
  Published in: Intergranular and Interphase Boundaries in Materials (p617)