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Articles by keyword: «Electrical Activity»

• A New Approach to Grain Boundary Engineering for Photovoltaic Polysilicon by Unidirectional and Rotational Solidification
  Published in: Recrystallization and Grain Growth III (p843)
• Amorphous SiO₂ Precipitates at Silicon Grain Boundaries
  Published in: Intergranular and Interphase Boundaries in Materials (p713)
• Analysis of Silicon Carbide and Silicon Nitride Precipitates in Block Cast Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p41)
• Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities
  Published in: Polycrystalline Semiconductors IV (p51)
• Defect Characterization of Poly-Ge and VFG-Grown Ge Material
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p483)
• Effects of Grain Boundary Structure and Chemistry on Electrical Activity in Polycrystalline Silicon
  Published in: Polycrystalline Semiconductors VII (p333)
• Formation of Electrical Activity of Dislocations in Si during Plastic Deformation
  Published in: Polycrystalline Semiconductors IV (p15)
• High-Strength Multifunctional Conducting Polymer Hydrogels
  Published in: Multi-Functional Materials and Structures III (p117)
• Microcharacterization of Polycrystalline Semiconductors by Scanning Electron Microscopy in Electron Beam Induced Current Mode
  Published in: Polycrystalline Semiconductors IV (p39)
• Polycrystalline Silicon Solar Cells: Improvements in Efficiency through Hydrogen Passivation
  Published in: Polycrystalline Semiconductors IV (p479)
• Scanning Deep Level Transient Spectroscopy Measurements of Extended Defects in Silicon
  Published in: Polycrystalline Semiconductors IV (p63)