Papers by Keyword: Electrical Connectors

Abstract: This paper mainly studies the effect of temperature cycling on stress relaxation behavior of contacts for electrical connectors. Based on the analysis of the test specifications of electrical connectors, this paper provides a kind of test method on stress relaxation behavior of electrical connector contacts under temperature cycling conditions. The detecting circuit is designed; the test is carried out and finally, according to the test data, it can be concluded that 1) for the same temperature change, the absolute change of strain within the temperatures above zero is bigger than that within the subzero temperatures; 2) the deformation of contacts gradually increases as the number of cycles increases. The length of the degradation process for electrical connectors might be related with the high temperature value, temperature variation or temperature variation rate.

Abstract: This paper mainly studies the effects of low temperature on the reliability of electrical connectors. Based on the theory of constant stress accelerated life test, this paper provides a kind of scheme of low temperature reliability test, which includes magnitude of the temperature stresses, the parameters measured during the test and so on. The detecting circuit is designed; the test is carried out and finally, according to the experimental data, it can be concluded that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) the forecast data show a tendency toward slightly lower value of contact resistance for each low temperature stress; 3) the lower the test temperature stress, the smaller the value of contact resistance, but the difference in contact resistance is tiny; 4) stress analysis of samples under low temperature is also helpful for correctly evaluating the effects of low temperature on the reliability of electrical connectors.

Abstract: This paper mainly studies one kind of failure prediction method on electrical connectors at high temperature. One scheme of high temperature reliability test was provided based on the theory of constant stress accelerated life test. The test device was designed; the test data was analyzed. It can be seen that 1) both the absolute change and the relative change of contact resistance are small for each temperature stress; 2) there is a tendency toward slightly higher value of contact resistance for each low temperature stress; 3) the higher the test temperature stress, the larger the value of contact resistance, but the difference in contact resistance is not very big. 4) The data prediction method such as the gray theory model is helpful for rapid failure prediction of electrical connectors at high temperature.