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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
Electromigration
»
58 papers on 4 pages:
1
[2]
[3]
[4]
[next]
3D-Simulation of Void Formation, Growth and Migration under Electromigration
Published in:
Diffusion in Materials - DIMAT2004
(p1306)
A New Approach to Understanding Electromigration in Al(Cu) Alloys on an Atomistic Basis
Published in:
Diffusion in Materials DIMAT2000
(p151)
A new Insight into the Electromigration Behavior of Copper Interconnects: The Roles of Grain Boundary and Surface Diffusion
Published in:
Diffusion in Materials DIMAT 1996
(p1673)
Ab Initio Calculation of the Electromigration Wind Valence in Metals
Published in:
Diffusion in Materials DIMAT 1996
(p1645)
Analysis of Mechanisms of Spark-Plasma Sintering
Published in:
High-Performance Ceramics V
(p1580)
Anomalous Enhancement of Structural Relaxation and Crystallization Processes in Amorphous Alloys Observed under Passing Electric Current
Published in:
Diffusion in Materials - DIMAT 1992
(p1187)
Aqueous Based Single Wafer Cu/Low-k Cleaning Process Characterization and Integration into Dual Damascene Process Flow
Published in:
Ultra Clean Processing of Silicon Surfaces VII
(p353)
Computer Simulations and Models on Electromigration in Al-Lines of Integrated Circuits
Published in:
Diffusion in Materials - DIMAT 1992
(p263)
Coupling of Electromigration and Non-Equilibrium Vacancies in Reactive Phase Growth
Published in:
Diffusion and Diffusional Phase Transformations in Alloys
(p53)
Crystal Texture and Electromigration Damage in Al-Based Interconnect Lines Studied by ACOM with the SEM
Published in:
Texture and Anisotropy of Polycrystals
(p573)
Direct Force Controversy in Electromigration Exit
Published in:
Defects and Diffusion in Semiconductors - An Annual Retrospective IX
(p77)
Effect of Grain Boundary/Interface Network on Cavity Growth due to Atom Migration Induced by Stress and Electric Current in Polycrystalline LSI Conductor
Published in:
Diffusion in Solids - Past, Present and Future
(p247)
Effective Valence of Protium and Deuterium in α Phase of Niobium
Published in:
Diffusion in Materials - DIMAT 1992
(p329)
Effects of Anolyte Concentration on Removal of Fluorine from Contaminated Soil by Electrokinetic Treatment
Published in:
Advances in Environmental Science and Engineering
(p2500)
Electromigration Analysis and Electro-Thermo-Mechanical Design for Package-on-Package (POP)
Published in:
Advances in Abrasive Technology XIII
(p929)
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