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Articles by keyword: «Electron Density»

• A Comparison of Quantum Correction Models for Nanoscale MOS Structures under Inversion Conditions
  Published in: Cross-Disciplinary Applied Research in Materials Science and Technology (p603)
• Atomic Environment of Positrons Annihilating in Different Parts of Cz-Si Single Crystal
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p507)
• Characteristics of 2.45GHz Microwave Plasma by Langmuir Probe Measurements
  Published in: Advances in Nanomaterials and Processing (p1621)
• Characteristics of Electron Density Distributions in Metal Oxides
  Published in: Designing, Processing and Properties of Advanced Engineering Materials (p77)
• Collective Surface Excitations in 3C-SiC(100)
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p347)
• Decomposition Characteristic of Carbon Tetrafluoride Using 2.45GHz Microwave at Various Gases
  Published in: Eco-Materials Processing and Design VIII (p701)
• Diagnostics of High-Rate a-Si:H Deposition in a Variable Frequency Plasma
  Published in: Hydrogenated Amorphous Silicon (p181)
• Electronic Structure of Pd-Ag(Au) Alloys Investigated by Positron Annihilation
  Published in: Positron Annihilation - ICPA-9 (p635)
• High Order X-ray Diffraction and Internal Atomic Layer Roughness of Epitaxial and Bulk SiC Materials
  Published in: Silicon Carbide and Related Materials - 1999 (p501)
• Local Structural Analysis of Al₂O₃, Cr:Al₂O₃ and V:Al₂O₃ Using Powder XRD
  Published in: Characterization of Technological Materials (p131)
• MEM-Based Structure-Refinement System REMEDY and its Applications
  Published in: European Powder Diffraction EPDIC 7 (p59)
• Plasma from Electron Beam Evaporation of a Metal Target
  Published in: Advances in Materials and Processing Technologies (p1190)
• Positron Annihilation in ZnO Varistors with Various Composition and Techniques
  Published in: Positron Annihilation - ICPA-10 (p521)
• Research on Internal Stress in Electroplated Cu Films on Fe Substrates and Ni Substrates - Based on Electron Theory
  Published in: Advances in Superalloys (p281)
• RTS Noise of CMOS Technology
  Published in: Materials Structure & Micromechanics of Fracture VI (p334)