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Articles by keyword: «Electron Mobility»

• 2DEG HEMT Mobility vs Inversion Channel MOSFET Mobility
  Published in: Silicon Carbide and Related Materials 2009 (p1207)
• A Theoretical Study of Electron Drift Mobility Anisotropy in n-Type 4H–and 6H–SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p725)
• An Analytic Model for Electron Mobility in Strained Si/Si_1-xGe_x nMOSFETs
  Published in: Equipment Manufacturing Technology and Automation (p1168)
• Charge Carrier Transport in μc-Si:H
  Published in: Ultrafast Phenomena in Semiconductors (p327)
• Collective Surface Excitations in 3C-SiC(100)
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p347)
• Comparative Monte Carlo Study of Electron Transport in 3C, 4H and 6H Silicon Carbide
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p291)
• Effect of Alloy Disorder Scattering on Electron Mobility Model for Strained-Si_1-xGe_x/Si (101)
  Published in: Liquid Crystals and Related Materials II (p364)
• Electrical Conductivity of Cu_2(1-x)W_xO_1+y
  Published in: Systems with Fast Ionic Transport - IV (p123)
• Electrical Transport Properties of n-Type 4H and 6H Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2003 (p555)
• Electron Mobility and Subband Population in Quantum Wells
  Published in: Ultrafast Phenomena in Semiconductors (p181)
• Electron Mobility in Moderately Doped Si_1-xGe_x
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p31)
• Electron Mobility Model for Strained-Si/(001) Si_1-XGe_x
  Published in: Optoelectronic Materials (p477)
• Electron Mobility Model of Strained Si_1-xGe_x(001)
  Published in: Liquid Crystals and Related Materials II (p378)
• Experimental Evidence of the Two-Dimensional Electron Gas in CdS Quantum Wells of CdS/ZnSe Heterostructures
  Published in: Ultrafast Phenomena in Semiconductors (p237)
• Hall Scattering Factor and Electron Mobility of 4H SiC: Measurements and Numerical Simulation
  Published in: Silicon Carbide and Related Materials - 1999 (p733)