Articles by keyword: «Electrostatic Force Microscopy»
4 papers on 1 page:
1
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An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy
Published in: Advances in Materials Manufacturing Science and Technology II (p161) -
Characterization of Double Stacking Faults Induced by Thermal Processing of Heavily N-Doped 4H-SiC Substrates
Published in: Silicon Carbide and Related Materials 2003 (p581) -
Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy
Published in: Polycrystalline Semiconductors VI (p33) -
Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)
Published in: Beam Injection Assessment of Defects in Semiconductors (p283)