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Papers by Keyword: Electrostatic Force Microscopy

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An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy

Authors: Hong Xi Wang, Jian Zhao, Jian Yuan Jia

161

Characterization of Double Stacking Faults Induced by Thermal Processing of Heavily N-Doped 4H-SiC Substrates

Authors: B.J. Skromme, M.K. Mikhov, L. Chen, G. Samson, Rong Jun Wang, Can Hua Li, I. Bhat

581

Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy

Authors: Dawn A. Bonnell, Sergei V. Kalinin

33

Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)

Authors: J.F. Bresse

283