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Articles by keyword: «Ellipsometry»

• In Situ Spectroscopic Ellipsometry Study of SiC Oxidation at Low Oxygen-Partial-Pressures
  Published in: Silicon Carbide and Related Materials 2009 (p813)
• Anisotropic Dielectric Function Properties of Semi-insulating 4H-SiC Determined from Spectroscopic Ellipsometry
  Published in: Silicon Carbide and Related Materials - 1999 (p571)
• Characterization and Production Metrology of Thin Transistor Gate Dielectric Films
  Published in: Ultra Clean Processing of Silicon Surfaces V (p177)
• Characterization of Low Pressure Chemical Vapor Deposited Polysilicon Using Ellipsometry
  Published in: Polycrystalline Semiconductors IV (p179)
• Correlation between Tribological Properties, sp²/sp³-Ratio and H-Content of Low-Wear Diamond-Like Carbon (DLC) Layers
  Published in: THERMEC 2011 (p2596)
• Delamination of Thin Layers in H⁺ Implanted Silicon Carbide
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p771)
• Determination of Thermal Conductivity of Amorphous Silicon Thin Films via Non-Contacting Optical Probing
  Published in: Experimental Mechanics in Nano and Biotechnology (p689)
• Effect of Preparation-Induced Surface Morphology on the Stability of H-Terminated Si(111) and Si(100) Surfaces
  Published in: Ultra Clean Processing of Silicon Surfaces VI (p179)
• Effect of the Matrix on the 1.5μm Photoluminescence of Er-Doped Silicon Quantum Dots
  Published in: Advanced Materials Forum III (p1116)
• Ellipsometric and MEIS Studies of 4H-SiC/Si/SiO₂ and 4H-SiC/SiO₂ Interfaces for MOS Devices
  Published in: Silicon Carbide and Related Materials 2006 (p509)
• Ellipsometric and XPS Studies of 4H-SiC/SiO₂ Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces
  Published in: Silicon Carbide and Related Materials 2005 (p1027)
• Ellipsometric Characterization of Copper Deposits
  Published in: Electrochemical Methods in Corrosion Research VI (p465)
• Ellipsometric Detection of Transitional Surface Structures on Decapped GaAs(001)
  Published in: Measurement Technology and Intelligent Instruments VI (p45)
• Ellipsometric Determination of the Density of TiO₂ passive Films on Ti Single Crystals: Combination of Ellipsometry and Coulometry
  Published in: Passivation of Metals and Semiconductors (p471)
• Ellipsometry to Access Structural Information of Electroactive Polymer Films
  Published in: Advanced Materials Forum II (p657)