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Articles by keyword: «Extended Defects»

• Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
  Published in: Silicon Carbide and Related Materials - 2002 (p317)
• Application of Surface Ab Initio Methods to Studies of Electronic Structure and Atomic Configuration of Interfaces in Metallic Materials
  Published in: Intergranular and Interphase Boundaries in Materials (p17)
• Au-Related Deep States in the Presence of Extended Defects in N-Type Silicon
  Published in: Defects in Semiconductors 17 (p1511)
• Characteristics of Planar Defects in Shallow Trenches Related to the Presence of Micropipes
  Published in: Silicon Carbide and Related Materials - 2002 (p277)
• Chemistry and Physics of Defect Interaction in Semiconductors
  Published in: Defect Interaction and Clustering in Semiconductors (p1)
• Correlation of Extended Defects on Carrier Lifetime in Thick SiC Epilayers
  Published in: Silicon Carbide and Related Materials 2011 (p297)
• Differences in Emission Spectra of Dislocations in 4H-SiC Epitaxial Layers
  Published in: Silicon Carbide and Related Materials 2007 (p345)
• Dopant Diffusion and Defect Formation in III-V Semiconductors: Zinc Diffusion in GaAs
  Published in: Diffusion in Materials DIMAT 1996 (p1095)
• Effects of Si₃N₄ Films on Diffusion of Boron and Extended Defects in Silicon during Post-Implantation Annealing
  Published in: Defects in Semiconductors 18 (p1891)
• Electrical Characterisation of Defects in Polycrystalline B-Doped Diamond Films
  Published in: Silicon Carbide and Related Materials 2011 (p1315)
• Electrical Properties of Clustered and Precipitated Iron in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p109)
• Electronic Properties of Stacking Faults in 15R-SiC
  Published in: Silicon Carbide and Related Materials - 2002 (p531)
• Electronic States Associated with Straight Dislocations in P-Type SiliconStudied by Means of Electric-Dipole Spin Resonance
  Published in: Defects in Semiconductors 18 (p1189)
• Electronic Structure, Atomic Configuration and Positron Annihilation Spectroscopy of Extended Defects in Metals
  Published in: Positron Annihilation - ICPA-11 (p420)
• Energetics of Extrinsic Defects in Si and their Role in Nonequilibrium Dopant Diffusion
  Published in: Defects and Diffusion in Semiconductors (p199)