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Articles by keyword: «Fixed Oxide Charge»

• Characteristics of Si-SiO₂ Systems Obtained by Thermal Oxidation of Silicon Surface Covered with Silicon-Hydrogen Layers
  Published in: Passivation of Metals and Semiconductors (p105)
• Characterization of SiC Passivation Using MOS Capacitor Ultraviolet-Induced Hysteresis
  Published in: Silicon Carbide and Related Materials 2004 (p589)
• Electrical Properties of ZrO₂ Capacitor Dielectrics Deposited by rf Magnetron Sputtering
  Published in: Advances in Nanomaterials and Processing (p13)
• Modification of SiO₂/4H-SiC Interface Properties by High-Pressure H₂O Vapor Annealing
  Published in: Silicon Carbide and Related Materials 2006 (p663)
• Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC(0001) Si-Face and (000-1) C-Face Substrates
  Published in: Silicon Carbide and Related Materials 2011 (p697)