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Articles by keyword: «Focused Ion Beam (FIB)»

• A Consideration of Cleavage Crack Propagation in Fe₂Si Steel
  Published in: Advances in Fracture and Damage Mechanics VII (p1)
• Analysis of the Intermetallic Compound Formed in Hot Dip Aluminized Steel
  Published in: THERMEC 2006 Supplement (p159)
• Application of FIB-EBSD Tomography for Understanding Annealing Phenomena in a Cold Rolled Particle-Containing Nickel Alloy
  Published in: Recrystallization and Grain Growth III (p413)
• Application of Highly Focused Ion Beams
  Published in: Materials Science Applications of Ion Beam Techniques (p445)
• Defects Analysis of Diamond Films in Cross Section Using Cathodoluminescence and High-Resolution Transmission Electron Microscopy
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p197)
• Development on Stress Monitoring Method for Measurement of Cyclic Stress of Railway Axles
  Published in: Advances in Fracture and Strength (p84)
• Fabricating Nanofluidic Channels and Applying them for DNA Molecules Study
  Published in: Nanoscience and Technology (p777)
• Fabrication of Carbon Nanotube Probes in Atomic Force Microscopy
  Published in: Advances in Abrasive Technology XII (p497)
• Fabrication of Silicon Nanopillar Sheet for Cell Culture Dish
  Published in: Advances in Materials and Processing Technologies II (p1352)
• FIB and TEM Studies on the Bainitic Microstructure in Low Carbon HSLA Steels
  Published in: Advanced Materials and Processing (p73)
• HVEM Study of Crack Tip Dislocations in Silicon Crystals
  Published in: PRICM-5 (p4043)
• Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization
  Published in: PRICM-5 (p9)
• Investigation of Microholes Produced by Focused Ion Beam Micromachining
  Published in: Advances in Materials and Processing Technologies II (p1346)
• Local Investigation of Microstructure-Induced Fatigue Damaging
  Published in: Advances in Fracture and Damage Mechanics VIII (p521)
• Measurement of Residual Stress in Thin-Sized Steel Wires by Using Focused Ion Beam and Digital Image Correlation Method
  Published in: Advanced Materials and Processing (p1187)