HOME
CONTACT
My eBook
Username:
Password:
FULLTEXT SEARCH
NEW:
Advanced Search
MSF
>
Materials Science Forum
KEM
>
Key Engineering Materials
SSP
>
Solid State Phenomena
DDF
>
Defect and Diffusion Forum
AMM
>
Applied Mechanics and Materials
AMR
>
Advanced Materials Research
AST
>
Advances in Science and Technology
JNanoR
>
Journal of Nano Research
JBBTE
>
Journal of Biomimetics, Biomaterials, and Tissue Engineering
JMNM
>
Journal of Metastable and Nanocrystalline Materials
JERA
>
International Journal of Engineering Research in Africa
AEF
>
Advanced Engineering Forum
NH
>
Nano Hybrids
> @scientific.net
CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by keyword: «
Focused Ion Beam (FIB)
»
25 papers on 2 pages:
[prev]
[1]
2
Measurement of Residual Stress in Thin-Sized Steel Wires by Using Focused Ion Beam and Digital Image Correlation Method
Published in:
Advanced Materials and Processing
(p1187)
Microstructures for High Precision Cemented Carbide Micro-Die Machined by FIB
Published in:
THERMEC'2003
(p1997)
On the Viability of FIB Tomography for Generating 3-D Orientation Maps in Deformed and Annealed Metals
Published in:
Fundamentals of Deformation and Annealing
(p55)
Recent Progress in the 3D Experimentation and Simulation of Nanoindents
Published in:
Fundamentals of Deformation and Annealing
(p199)
Sputtered Cu Films Containing Various Insoluble Substances for Advanced Barrierless Metallization
Published in:
THERMEC 2006
(p3497)
The Analysis of Focused Ion Beam Processing Characteristics for Micro Mold Fabrication
Published in:
Advances in Abrasive Technology IX
(p649)
The Brittle Fracture of Polycrystalline Zinc
Published in:
Advances in Fracture and Damage Mechanics VI
(p41)
The Field Emission Properties of Sub-Micrometer Diamond Tube Arrays Fabricated by Focused Ion Beam Pattern
Published in:
PRICM-5
(p3583)
Three-Dimensional Texture Analysis
Published in:
Textures of Materials - ICOTOM 14
(p237)
Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si
Published in:
Defects and Diffusion in Semiconductors IV
(p225)
Username:
Password: