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Articles by keyword: «Fourier Transform Infrared Spectroscopy»

• Analysis of Minute StrainFields around Microdefects in Silicion Crystals by Plane-Wave X-Ray Topography
  Published in: Defect and Diffusion Forum Vols. 138-139 (p49)
• Hydridosilane Modification of Metals: An Exploratory Study
  Published in: NEMS/MEMS Technology and Devices - ICMAT2011 (p111)
• Improved Measurement of Carbon in Poly- and CZ Crystal Silicon by Means of Low Temperature FTIR
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p591)
• Infrared Transmission Investigations of Rod - Like Defects in Multicrystalline Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p501)
• Preparation and Characterization of Polylactide-co-glycolide/Carbonate Apatite (PLGA/CHA) Composite Scaffolds
  Published in: Bioceramics 23 (p572)
• Quantitative Analysis and Study of Coal Mine Underground Environment Gases Based on the FTIR
  Published in: Advanced Research on Mechanical Engineering, Industry and Manufacturing Engineering (p878)
• Relation between Minute Lattice Strain and Anomalous Oxygen Precipitation in a Czochralski-Grown Silicon Crystal
  Published in: Defects in Semiconductors 18 (p1743)
• Synthesis and Characterization of Hybrid Polymer PAFC–CPAM
  Published in: New Materials, Applications and Processes (p327)
• Tuning Residual Stress in 3C-SiC(100) on Si(100)
  Published in: Silicon Carbide and Related Materials 2009 (p159)