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Articles by keyword: «Glancing Angle X-Ray Diffraction (GAXRD)»

• Oxidation of Pure Si₃N₄: Spectroscopic Ellipsometry and Glancing Angle X-Ray Diffraction Studies
  Published in: Silicon Nitride '93 (p301)
• Preferred Orientation of Cu₂O Nano-/Micro-Protrusions Grown by Ar Ion Irradiation
  Published in: THERMEC 2009 (p1784)
• Preparation and Characterisation of TiO₂ Thick Films by Gel Oxidation
  Published in: PRICM 6 (p2167)
• Preparation and Characterisation of TiO₂ Thick Films Fabricated by Anodic Oxidation
  Published in: PRICM 6 (p2159)
• Preparation and Characterisation of TiO₂ Thick Films Fabricated by Electrophoretic Deposition
  Published in: PRICM 6 (p2163)
• X-Ray Scattering from Thin Films and Multilayers
  Published in: European Powder Diffraction EPDIC 8 (p65)