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Articles by keyword: «Helium»

• A New Approach to Study the Damage Induced by Inert Gases Implantation in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p357)
• Accurate Identification of Radiation Defect Profiles in Silicon after Irradiation with Protons and Alpha-Particles in the MeV Range
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p387)
• Buried Insulating Layer Formation in Cz Si Wafers after Helium Implantation, Nitrogen Plasma Treatment and Annealing
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p91)
• Buried Nano - Structured Layers in High Temperature – Pressure Treated Si:He
  Published in: High Pressure Technology of Nanomaterials (p285)
• Controlled Gettering of Implanted Platinum in Silicon Produced by Helium Co-Implantation
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p559)
• Corrosion of High Temperature Alloys in the Coolant Helium of a Gas Cooled Reactor
  Published in: High Temperature Corrosion and Protection of Materials 6 (p1165)
• Damage Behavior of Electron/Helium Dual-Beam Irradiation on Fe-Cr-Mn (W, V) Alloy
  Published in: PRICM-5 (p1463)
• Defects Created by Helium Implantation at Different Temperatures in Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p285)
• Defects Created by Multi-Energy He Implantation of Silicon at High Temperatures
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p319)
• Depth-Dependence Recovery of Helium-Implanted 18 Carats Gold-Silver Alloy
  Published in: Positron Annihilation - ICPA-12 (p484)
• Effect of Helium and Aging Treatment on Radiation Damage Behavior in Low Activation Fe-Cr-Mn (W, V) Alloy
  Published in: PRICM-5 (p1455)
• Effect of Helium on Synthesis of Carbon Nanotubes from the V-Type Pyrolysis Flame
  Published in: Advanced Polymer Science and Engineering (p540)
• Elastic Scattering of Positrons by Helium and Neon Atoms
  Published in: Positron Annihilation - ICPA-9 (p553)
• Electrical Characterisation of 4H-SiC Epitaxial Samples Treated by Hydrogen or Helium
  Published in: Silicon Carbide and Related Materials 2006 (p347)
• Energy Loss of Positronium in Helium Gas
  Published in: Positron Annihilation - ICPA-9 (p1671)