HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «High Energy X-Ray Diffraction»

• In Situ Observation of Oxygen Precipitation in Silicon with High Energy X-Rays
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p437)
• Atomic-Scale Structure of Polymer-Route Si-C-O Fibers Observed by Synchrotron Radiation X-Ray Diffraction
  Published in: Innovation in Ceramic Science and Engineering (p65)
• In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC
  Published in: Silicon Carbide and Related Materials 2006 (p267)
• The Build-Up of Strain Fields in Czochralski-Si Observed in Real Time by High Energy X-Ray Diffraction
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p631)
• Thermal Expansion Coefficients of 6H Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2007 (p517)
• Through-Thickness Texture Variations Determined Non-Destructively by High Energy Synchrotron Radiation
  Published in: Texture and Anisotropy of Polycrystals (p271)