Papers by Keyword: High Resolution Electron Microscopy (HREM)

Paper TitlePage

Symmetric (011)Tilt Grain Boundaries in Si and Ge: Interfacial Dislocation Concept
Authors: Jean-Luc Putaux, J. Thibault, Alain Jacques, A. George
73
HREM Study of Grain and Interphase Boundaries: Structural and Chemical Aspects
Authors: Jean-Michel Pénisson
35
Showing 91 to 92 of 92 Paper Titles