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Articles by keyword: «Impurities»

• A Study on Impurities in Poly-Si Wafers Obtained from Vacuum Casting and their Effect on Solar Cell Efficiency
  Published in: Polycrystalline Semiconductors VII (p153)
• Aluminum Recycling - Challenges and Opportunities
  Published in: Advances in Materials and Processing Technologies (p571)
• Application of the Bethe-Peierls-Weiss Method to Yttrium Iron Garnet Containing Y³⁺ Impurity
  Published in: EMMA-2000 (p381)
• Beam Injection Methods as Tools for Studying Extended Defects in Semiconductors: Characteristics and Capabilities
  Published in: Polycrystalline Semiconductors IV (p51)
• Calculating the Properties of Defects in Semiconductors at Finite Temperatures
  Published in: Defects and Diffusion in Semiconductors - An Annual Retrospective VII (p47)
• Characteristics of Slowly Cooled Zr-Al-Cu-Ni Bulk Samples with Different Oxygen Content
  Published in: Mechanically Alloyed, Metastable and Nanocrystalline Materials (p797)
• Corrosion of High Temperature Alloys in the Coolant Helium of a Gas Cooled Reactor
  Published in: High Temperature Corrosion and Protection of Materials 6 (p1165)
• Defects in Semi-Insulating SiC Substrates
  Published in: Silicon Carbide and Related Materials - 2002 (p45)
• Development of a High Rate 4H-SiC Epitaxial Growth Technique Achieving Large-Area Uniformity
  Published in: Silicon Carbide and Related Materials 2007 (p111)
• Ecomaterial Processing for Recycling of Iron Scrap Containing Impurities
  Published in: THERMEC'2003 (p3347)
• Effect of Defects on Electrical Property of Multi-Crystalline Silicon
  Published in: Mechanical Engineering, Materials and Energy (p947)
• Effect of Trace Impurities on High-Cycle Fatigue Damage of Ultrafine Grained Copper Processed by Equal Channel Angular Pressing
  Published in: Nanomaterials by Severe Plastic Deformation IV (p809)
• Effects of Ionicity on Defect Physics of Wide-Band-Gap Semiconductors
  Published in: Silicon Carbide and Related Materials 2003 (p15)
• Effects of Non-Equilibrium Vacancies on Strengthening
  Published in: Plasticity of Metals and Alloys (p287)
• Electronic and Electrical Properties of Polycrystalline Silicon: Effects of Grain Boundary Segregation
  Published in: Polycrystalline Semiconductors IV (p21)