HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «In Situ Measurement»

• In Situ Determination of Glass Transition Temperatures of Epoxy Adhesives in Structural Ceramic Assemblies
  Published in: New Approaches in the Manufacturing Processes (p107)
• In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading
  Published in: Advanced Material Science and Technology (p615)
• A In Situ Measuring Method for Stress Gradient of a MEMS Film
  Published in: Micro and Nano Technology (p357)
• A Novel In Situ Roughness Measurement Based on Spatial Average Analysis of Binary Speckle Image
  Published in: Materials Processing Technologies (p1125)
• Complex Shape Forming of Flax Based Woven Fabrics - Analysis of the Yarn Tensile Strain during the Process
  Published in: Material Forming ESAFORM 2012 (p231)
• Current Status of Engineering Materials Diffractometer at J-PARC
  Published in: Residual Stresses VIII (p443)
• In Situ Investigation of Debinding of Non-Oxide Ceramic
  Published in: 11th International Ceramics Congress (p1684)
• In Situ Investigation of Orientation Changes during Heating of Extruded AZ31
  Published in: PRICM 6 (p183)
• In Situ Measurement of Internal Stress in Electroless Plating by Television Holographic Interferometry
  Published in: Advances in Experimental Mechanics IV (p65)
• In Situ Micro Raman Spectroscopy for Characterization of Oxide Film Formed on the New Surface and for Measurements of the Stress of Oxide Film Formed on 304L Stainless Steel
  Published in: Advances in Fracture and Failure Prevention (p913)
• In Situ X-Ray Measurements of Defect Generation during PVT Growth of SiC
  Published in: Silicon Carbide and Related Materials 2006 (p267)
• Indentation Fatigue and In Situ Inspection of Damage Evolution for Glass
  Published in: Testing and Evaluation of Inorganic Materials I (p451)
• In-Situ Shrinkage Measurements of LTCC Multilayers by Means of an Optical Dilatometer
  Published in: Euro Ceramics VII (p1281)
• Irradiation Temperature Dependence of Residual Defects in 17MeV-Proton Bombarded Silicon
  Published in: Defects in Semiconductors 18 (p1159)
• Numerical Simulation of Subway Train Vertical Random Vibration Load in Time Domain
  Published in: Materials Science and Information Technology (p68)