Papers by Keyword: Instrument Cluster

Abstract: In the production process of electronic Instrument Clusters (IC) used in automobiles, a need for automated inspection of dynamic characteristics is identified. An inspection system based on hardware-in-loop emulation and computer vision using Computer Unified Device Architecture (CUDA) is proposed. The system generates network signals that emulate a real vehicle, sends the signals to an IC to turn it into various work conditions, captures the IC’s response into a graphic processing unit for real-time computer-vision processing and records inspection results into databases. An implementation of the design and performance analysis is provided.