| Paper Title | Page |
|---|---|
|
1D SiCf-YMAS Glass-Ceramic Composites: Microstructure, Interfaces and Creep Behaviour Authors: Jean-Louis Chermant, F. Doreau, Jean Vicens |
591 |
|
4H-SiC Oxide Characterization with SIMS Using a 13C Tracer Authors: Jody Fronheiser, Kevin Matocha, Vinayak Tilak, Leonard C. Feldman |
513 |
|
A 4-Cylinder Model to Evaluate Interfacial Properties of Fibre-Reinforced Composites Authors: Hamid Reza Daghyani, A. Hosseini Monnazah, Lin Ye |
553 |
|
A Criterion for Crack Kinking Out of an Interface Authors: Dominique Leguillon, Sébastien Murer |
9 |
|
A Diffusion of Positrons by an Electric Field in MOS Transistors Authors: Akira Uedono, Long Wei, Y. Tabuki, H. Kondo, Shoichiro Tanigawa, Y. Ohji |
1475 |
|
A Finite Element Analysis of a Crack Penetrating or Deflecting into an Interface in a Thin Laminate Authors: Sharon Kao-Walter, Per Ståhle, Shao Hua Chen |
173 |
|
Authors: Oleg Velichko, A.K. Fedotov |
513 |
|
A New-Type of Defect Generation at a 4H-SiC/SiO2 Interface by Oxidation Induced Compressive Strain Authors: Kenta Chokawa, Shigenori Kato, Katsumasa Kamaiya, Kenji Shiraishi |
469 |
|
A Point Dislocation Interacting with an Elliptical Hole Located at a Bi-Material Interface Authors: Xian Feng Wang, Feng Xing, Norio Hasebe, P.B.N. Prasad |
75 |
|
Authors: Xiao Lin Lu, Zhan Chen, Xin Ping Wang |
703 |