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Articles by keyword: «Interferometry»

• A Signal to Noise Optimization Algorithm for Speckle Interferometry Applications
  Published in: Advances in Experimental Mechanics VI (p29)
• Application of Diode Lasers in Interferometrical Length Measurements
  Published in: Measurement Technology and Intelligent Instruments IX (p423)
• Correlation Study between a New Interferometric Asphere Metrology System and Fizeau Interferometer
  Published in: Optics Design and Precision Manufacturing Technologies (p1142)
• Damage Assessment in Bonded Composite Joints
  Published in: Damage Assessment of Structures V (p501)
• Detection of Impact Defects in Laminated Composites by Holographic Interferometry
  Published in: Advanced Materials Forum I (p279)
• Determination of SC1 Etch Rates at Low Temperatures with Microscope Interferometry
  Published in: Ultra Clean Processing of Silicon Surfaces IV (p275)
• Development of Scanning Microwave Technology for Ceramics in Extreme Environments
  Published in: 12th INTERNATIONAL CERAMICS CONGRESS PART D (p153)
• Diagnostics of Residual Stressed State of Welded Structures Using the Methods of Holographic Interferometry and Electron Speckle-Interferometry
  Published in: Residual Stresses VI, ECRS6 (p867)
• Direct Strain and Slope and Slope Measurement Using 2D DSPSI
  Published in: Advances in Innovative Materials and Applications (p384)
• Effects of the Interface Curvature and Dendrite Orientation in Directional Solidification of Bulk Transparent Alloys
  Published in: Solidification and Gravity IV (p337)
• Fractal Analysis of Fracture Surfaces of Steel Charpy Specimens
  Published in: Advances in Strength of Materials (p43)
• High-Resolution Dimensional Metrology for Industrial Applications
  Published in: Measurement Technology and Intelligent Instruments IX (p113)
• Instantaneous Spatial Phase-Stepping Methods for Phase-Measuring Interferometry and Photoelasticity
  Published in: Experimental Mechanics in Nano and Biotechnology (p39)
• Investigation of Correlation between Polishing Characteristic and Pad Roughness during Chemical Mechanical Planarization Process
  Published in: Key Engineering Materials II (p831)
• Key Technologies in Image Processing of Interferogram
  Published in: Advanced Measurement and Test (p1719)